IN-2025-C4003-MU
Location
India
Internship type
ON-SITE
Reference number
IN-2025-C4003-MU
General discipline
Electrical Engineering
Electronics Engineering
Physics and Physical Sciences
Completed Years of Study
2
Fields of Study
Languages
English Excellent (C1, C2)
Required Knowledge and Experience
-
Other Requirements
-
Duration
6 - 8 Weeks
Within These Dates
01.06.2025 - 31.12.2025
Holidays
NONE
Work Environment
-
Gross pay
9000 INR / month
Working Hours
40.0 per week / 8.0 per day
Type of Accommoditation
IAESTE India LC Manipal
Cost of lodging
-
Cost of living
4500 INR / month
Additional Info
Work description
Project Title: Optical and electrical characterization of compound semiconductor nano films for sensor device applications.Detailed Project Description: The fabrication of nanometer-scale inorganic materials with special morphologies is of great interest to material chemists due to their significant impact on both fundamental scientific research and technological applications, particularly in compound semiconducting materials. The optical and electrical properties of these semiconductors are highly sensitive to the structure and composition of the deposits. The deposition method and preparation conditions play a critical role in determining these characteristics. Several reports have been published on the preparation of compound semiconductor nanofilms using chemical techniques, but inconsistencies in the reported data on their structural, optical, and electrical properties exist. The optical and electrical properties of these films can be fine-tuned by altering their composition and structure. Therefore, comprehensive studies on the influence of preparation parameters on the structure, composition, and physical properties of these films are essential for optimizing their use in optoelectronic devices.Outcomes of the Project: • Understand the various routes of preparation techniques of nanomaterial’s• Understand the various tools used for characterization of nano-films.Expected Results: Helps to fabricating and characterizing of optical nano sensors
Deadline
30.04.2025